Figure 1From: A novel nanoscopic tool by combining AFM with STED microscopy Schematic of the experimental setup. (a) The AFM scan head can be easily applied to the microscope. (b) Coarse overlay of the tip position with the scan field area by reflection measurements (logarithmic colorscale). Scale bar 5 μm. (c) 3D rendered illustration of the experimental conditions within the sample area.Back to article page